Spherical nanoindentation, modeling and transmission electron microscopy evidence for ripplocations in Ti3SiC2
نویسندگان
چکیده
منابع مشابه
High-resolution transmission electron microscopy using negative spherical aberration.
A novel imaging mode for high-resolution transmission electron microscopy is described. It is based on the adjustment of a negative value of the spherical aberration C S of the objective lens of a transmission electron microscope equipped with a multipole aberration corrector system. Negative spherical aberration applied together with an overfocus yields high-resolution images with bright-atom ...
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ژورنال
عنوان ژورنال: Acta Materialia
سال: 2017
ISSN: 1359-6454
DOI: 10.1016/j.actamat.2017.03.055